TY - JOUR A1 - Peñaranda Foix, Felipe Laureano AU - Sánchez Hernández, David Agapito AU - Reyes Davó, Elías de los AU - Catalá Civera, José Manuel T1 - Precise dielectric properties determination of laminar shaped materials in a partially filled waveguide Y1 - 1999 UR - http://hdl.handle.net/10317/1226 AB - An enhanced technique for complex dielectric properties characterization of laminar-shaped materials is presented. The technique is based upon scattering measurements of a partially-filled rectangular waveguide. The influence of the different parameters regarding the achievable accuracy have also been analyzed in order to determine the optimum sample configuration. Measurements of some commercial dielectric substrates used for printed antenna design were performed and have been used for validation purposes KW - Teoría de la Señal y las Comunicaciones KW - Parámetros-S KW - Medición de pérdidas dieléctricas KW - Propiedades dieléctricas KW - Ondas guía de carga dieléctrica KW - Errores de medición KW - Permitividad de medición KW - Guias de onda rectangular KW - Teoría de guía de ondas KW - S-parameters KW - Dielectric loss measurement KW - Dielectric properties KW - Measurement errors KW - Rectangular waveguides KW - Waveguide theory KW - Permittivity measurement KW - Antena de microfranja KW - Microstrip antenna KW - Dielectric loaded waveguides LA - eng PB - Institute Electrical and Electronics Engineers (IEEE) ER -