Coaxial to waveguide transitions and device under test characterization by means of inverse techniques

Abstract

A new two-tier inverse characterization technique for coaxial to waveguide transitions including a device under test is presented in this paper. The transitions and the device under test are characterized by its scattering parameters and a cascade procedure is used in order to compare calculations and measurements during the unterminating procedure. Two different standard types such as short-circuits and thrus are used, and the two transitions jointly with the device under test are simultaneously characterized. Genetic algorithms and a gradient based method have been used for error minimization during the unterminating stage. Results of this two-tier inverse technique are compared to those provided by measurements, simulations and the three-cavity method, showing that it is possible to properly characterize the coaxial to waveguide transitions and the device under test in a flexible and accurate way.