Coaxial to waveguide transitions and device under test characterization by means of inverse techniques
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Monzó Cabrera, Juan; Clemente Fernández, Francisco Javier; Pedreño Molina, Juan Luis; Díaz Morcillo, Alejandro Benedicto; Lozano Guerrero, Antonio JoséGrupo de investigación
Grupo de Electromagnetismo y Materia (GEM)Área de conocimiento
Teoría de la Señal y las ComunicacionesPatrocinadores
This work was supported in part by the Ministerio de Ciencia e Innovación under the project with reference CIT-020000-2008-43.Fecha de publicación
2010-06Editorial
John Wiley & SonsCita bibliográfica
LOZANO GUERRERO, Antonio José, MONZÓ CABRERA, Juan, CLEMENTE FERNÁNDEZ Francisco Javier, PEDREÑO MOLINA, Juan Luis, DÍAZ MORCILLO, Alejandro. Coaxial to waveguide transitions and device under test characterization by means of inverse techniques. Microwave and Optical Technology Letters, 52 (6): 1294-1297, Junio 2010. ISSN 0895-2477Revisión por pares
siPalabras clave
Transición coaxial de guía de ondaDispositivos bajo prueba
Técnicas inversas
Calibración de dos niveles
Coaxial to waveguide transitions
Device under test
Inverse techniques
Two-tier calibration
Algoritmos genéticos (AG)
Genetic Algorithm (GA)
Resumen
A new two-tier inverse characterization technique for coaxial to waveguide transitions including a device under test is presented in this paper. The transitions and the device under test are characterized by its scattering parameters and a cascade procedure is used in order to compare calculations and measurements during the unterminating procedure. Two different standard types such as short-circuits and thrus are used, and the two transitions jointly with the device under test are simultaneously characterized. Genetic algorithms and a gradient based method have been used for error minimization during the unterminating stage. Results of this two-tier inverse technique are compared to those provided by measurements, simulations and the three-cavity method, showing that it is possible to properly characterize the coaxial to waveguide transitions and the device under test in a flexible and accurate way.
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