Exploring the validity of plane and spherical millimeter-wave incidences for multiple-diffraction calculations in wireless communication systems
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López Segovia, Alba; Rodríguez Rodríguez, Ignacio; Rodríguez Rodríguez, José Víctor; Juan Llácer, Leandro; Campo Valera, María Mercedes; [et al.]Knowledge Area
Teoría de la Señal y las ComunicacionesSponsors
Ignacio Rodríguez-Rodríguez would like to thank Plan Andaluz de Investigación, Desarrollo e Innovación (PAIDI), Junta de Andalucía, Spain. María Campo-Valera is grateful for postdoctoral program Margarita Salas—Spanish Ministry of Universities (financed by European Union—NextGenerationEU).Publication date
2023Publisher
MDPIBibliographic Citation
López-Segovia, A.; Rodríguez-Rodríguez, I.; Rodríguez, J.-V.; Juan-Llácer, L.; Campo-Valera, M.; Woo, W.L. Exploring the Validity of Plane and Spherical Millimeter-Wave Incidences for Multiple-Diffraction Calculations in Wireless Communication Systems. Electronics 2023, 12, 2020. https://doi.org/10.3390/electronics12092020Keywords
Radio communication systemsMultiple diffraction
Millimeter-wave frequency band
Uniform theory of diffraction
Abstract
The focus of this work is to determine at which threshold can the results for both plane and spherical wave incidence assumptions either converge or deviate when performing multiple diffraction attenuation calculations. The analysis has been carried out—for various millimeter-wave frequencies, inter-obstacle spacings, and angles of incidence—by employing a pair of two-dimensional (2D) hybrid formulations based on both the uniform theory of diffraction and physical optics (UTDPO). This way, we seek to demonstrate under which circumstances each wave incidence assumption can be valid in environments that entail millimeter-wave bands. Based on this, we may ensure the minimum necessary distance from the transmitter to the first diffracting obstacle for the convergence of the spherical wave incidence solution onto that of the plane wave with a relative error below 0.1%. Our results demonstrate that for less than four diffracting elements, the minimum necessary distance engages in quasi-linear ...
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