Precise dielectric properties determination of laminar shaped materials in a partially filled waveguide

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URI: http://hdl.handle.net/10317/1226
ISBN: 0-7803-5639- X
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Author
Peñaranda Foix, Felipe Laureano; Sánchez Hernández, David Agapito; Reyes Davó, Elías de los; Catalá Civera, José Manuel
Research Group
Grupo de Ingeniería de Microondas, Radiocomunicaciones y Electromagnetismo (GIMRE)
Knowledge Area
Teoría de la Señal y las Comunicaciones
Publication date
1999-08
Publisher
Institute Electrical and Electronics Engineers (IEEE)
Bibliographic Citation
CATALÁ CIVERA, J.M., PEÑARANDA FOIX, F., SÁNCHEZ HERNÁNDEZ, D., REYES, E. de los. Precise dielectric properties determination of laminar shaped materials in a partially filled waveguide. En: IEEE Antennas and Propagation Society International Symposium (1999: Orlando, Florida, USA). IEEE Antennas and Propagation Society International Symposium. 1999 Digest. Held in conjunction with: USNC/URSI National Radio Science Meeting. Orlando, Florida: Institute Electrical and Electronics Engineers. 1999. 1942 - 1945 p. vol.3. ISBN 0-7803-5639- X
Keywords
Parámetros-S
Medición de pérdidas dieléctricas
Propiedades dieléctricas
Ondas guía de carga dieléctrica
Errores de medición
Permitividad de medición
Guias de onda rectangular
Teoría de guía de ondas
S-parameters
Dielectric loss measurement
Dielectric properties
Measurement errors
Rectangular waveguides
Waveguide theory
Permittivity measurement
Antena de microfranja
Microstrip antenna
Dielectric loaded waveguides
Abstract
An enhanced technique for complex dielectric properties characterization of laminar-shaped materials is presented. The technique is based upon scattering measurements of a partially-filled rectangular waveguide. The influence of the different parameters regarding the achievable accuracy have also been analyzed in order to determine the optimum sample configuration. Measurements of some commercial dielectric substrates used for printed antenna design were performed and have been used for validation purposes
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