TY - JOUR 
A1 - Martínez Viviente, Félix Lorenzo
AU - Hinojosa Jiménez, Juan
AU - Doménech Asensi, Ginés
AU - Fernández Luque, Francisco Jesús
AU - Zapata Pérez, Juan Francisco
AU - Ruiz Merino, Ramón Jesús
AU - Pardo Mata, Lorena
T1 - Dielectric constant tunability at microwave frequencies and pyroelectric behavior of lead-free submicron-structured (Bi0.5Na0.5)1-xBaxTiO3 ferroelectric ceramics
Y1 - 2013
SN - 0885-3010
UR - http://hdl.handle.net/10317/5394
AB - In this article we show that the dielectric constant of lead-free ferroelectric ceramics based on the solid solution (1-x)(Bi0.5Na0.5)TiO3-xBaTiO3, with compositions at or near the morphotropic phase boundary (MPB), can be tuned by a local applied electric field. Two compositions have been studied, one at the MPB, with x=0.06 (BNBT6), and another one towards the BNT side of the phase diagram, with x=0.04 (BNBT4). The tunability of the dielectric constant is measured at microwave frequencies between 100 MHz and 3 GHz by a non-resonant method and simultaneously applying a DC electric field. As expected, the tunability is higher for the composition at the MPB (BNBT6), reaching a maximum value of 60 % for an electric field of 900 V/cm, compared with the composition below this boundary (BNBT4), which saturates at 40 % for an electric field of 640 V/cm. The high tunability in both cases is attributed to the fine grain and high density of the samples, which have a submicron homogeneous grain structure with grain size of the order of a few hundred nanometers. Such properties make these ceramics attractive for microwave tunable devices. Finally, we have tested these ceramics for their application as infrared pyroelectric detectors and we have found that the pyroelectric figure of merit is comparable to traditional lead containing pyroelectrics.
KW - Ferroelectric ceramics
KW - Dielectric permittivity
KW - Microwave tunable devices
KW - Pyroelectric infrared sensors
KW - 2202.10 Radioondas y Microondas
LA - eng
PB - Institute of Electrical and Electronics Engineers (IEEE)
ER -