TY - JOUR 
A1 - Monzó Cabrera, Juan
AU - Clemente Fernández, Francisco Javier
AU - Pedreño Molina, Juan Luis
AU - Díaz Morcillo, Alejandro Benedicto
AU - Lozano Guerrero, Antonio José
T1 - Coaxial to waveguide transitions and device under test characterization by means of inverse techniques
Y1 - 2010
SN - 0895-2477
UR - http://hdl.handle.net/10317/1575
AB - A new two-tier inverse characterization technique for coaxial to waveguide transitions including a device under test is presented in this paper. The transitions and the device under test are characterized by its scattering parameters and a cascade procedure is used in order to compare calculations and measurements during the unterminating procedure. Two different standard types such as short-circuits and thrus are used, and the two transitions jointly with the device under test are simultaneously characterized. Genetic algorithms and a gradient based method have been used for error minimization during the unterminating stage. Results of this two-tier inverse technique are compared to those provided by measurements, simulations and the three-cavity method, showing that it is possible to properly characterize the coaxial to waveguide transitions and the device under test in a flexible and accurate way.
KW - Teoría de la Señal y las Comunicaciones
KW - Transición coaxial de guía de onda
KW - Dispositivos bajo prueba
KW - Técnicas inversas
KW - Calibración de dos niveles
KW - Coaxial to waveguide transitions
KW - Device under test
KW - Inverse techniques
KW - Two-tier calibration
KW - Algoritmos genéticos (AG)
KW - Genetic Algorithm (GA)
LA - eng
PB - John Wiley & Sons
ER -