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dc.contributor.authorMonzó Cabrera, Juan 
dc.contributor.authorClemente Fernández, Francisco Javier 
dc.contributor.authorPedreño Molina, Juan Luis 
dc.contributor.authorDíaz Morcillo, Alejandro Benedicto 
dc.contributor.authorLozano Guerrero, Antonio José 
dc.date.accessioned2011-01-31T08:33:33Z
dc.date.available2011-01-31T08:33:33Z
dc.date.issued2010-06
dc.identifier.citationLOZANO GUERRERO, Antonio José, MONZÓ CABRERA, Juan, CLEMENTE FERNÁNDEZ Francisco Javier, PEDREÑO MOLINA, Juan Luis, DÍAZ MORCILLO, Alejandro. Coaxial to waveguide transitions and device under test characterization by means of inverse techniques. Microwave and Optical Technology Letters, 52 (6): 1294-1297, Junio 2010. ISSN 0895-2477eng
dc.identifier.issn0895-2477
dc.description.abstractA new two-tier inverse characterization technique for coaxial to waveguide transitions including a device under test is presented in this paper. The transitions and the device under test are characterized by its scattering parameters and a cascade procedure is used in order to compare calculations and measurements during the unterminating procedure. Two different standard types such as short-circuits and thrus are used, and the two transitions jointly with the device under test are simultaneously characterized. Genetic algorithms and a gradient based method have been used for error minimization during the unterminating stage. Results of this two-tier inverse technique are compared to those provided by measurements, simulations and the three-cavity method, showing that it is possible to properly characterize the coaxial to waveguide transitions and the device under test in a flexible and accurate way.eng
dc.description.sponsorshipThis work was supported in part by the Ministerio de Ciencia e Innovación under the project with reference CIT-020000-2008-43.eng
dc.formatapplication/pdf
dc.language.isoengeng
dc.publisherJohn Wiley & Sonseng
dc.rightsCopyright © 2010 John Wiley & Sons. The definitive version is available at www3.interscience.wiley.comeng
dc.titleCoaxial to waveguide transitions and device under test characterization by means of inverse techniqueseng
dc.typeinfo:eu-repo/semantics/articleeng
dc.subject.otherTeoría de la Señal y las Comunicacioneseng
dc.subjectTransición coaxial de guía de ondaeng
dc.subjectDispositivos bajo pruebaeng
dc.subjectTécnicas inversaseng
dc.subjectCalibración de dos niveleseng
dc.subjectCoaxial to waveguide transitionseng
dc.subjectDevice under testeng
dc.subjectInverse techniqueseng
dc.subjectTwo-tier calibrationeng
dc.subjectAlgoritmos genéticos (AG)
dc.subjectGenetic Algorithm (GA)
dc.identifier.urihttp://hdl.handle.net/10317/1575
dc.peerreviewsieng
dc.contributor.investgroupGrupo de Electromagnetismo y Materia (GEM)eng
dc.identifier.doi10.1002/mop.25159
dc.identifier.urlhttp://onlinelibrary.wiley.com/doi/10.1002/mop.25159/abstract
dc.rights.accessRightsinfo:eu-repo/semantics/openAccesseng
dc.type.versioninfo:eu-repo/semantics/submittedVersioneng


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