Assessment of complex radiated EMC problems involving slotted enclosures using a 2-D generalized circuital approach
Autor
Balbastre Tejedor, Juan Vicente; Nuño Fernández, Luis; Lozano Guerrero, Antonio José; Díaz Morcillo, Alejandro BenedictoGrupo de investigación
Grupo de Electromagnetismo y Materia (GEM)Área de conocimiento
Teoría de la Señal y las ComunicacionesFecha de publicación
2007Editorial
IEEE Electromagnetic Compatibility SocietyCita bibliográfica
BALBASTRE, Juan V., NUÑO, Luis, DÍAZ MORCILLO, Alejandro, LOZANO, Antonio. Assessment of complex radiated EMC problems involving slotted enclosures using a 2-D generalized circuital approach. IEEE Transactions on Electromagnetic Compatibility, 49 (3): 543 - 552 p., 2007. ISSN 0018-9375Palabras clave
Compatibilidad electromagnéticaAnálisis circuital generalizado
Problemas dentro del sistema
Emisiones radiadas y susceptibilidad
Electromagnetic compatibility (EMC)
Generalized circuital analysis (GCA)
Intrasystem problems
Radiated emissions and susceptibility
Resumen
A 2-D version of the generalized circuital analysis
(GCA) has been used along with the finite element method (FEM)
to estimate both the radiated perturbation produced by an arbitrary
current distribution (represented by a set of linear current
sources) covered by a slotted enclosure, and the field coupled to a
slotted screen due to a radiated perturbation. The effect of a given
enclosure is modeled by means of a scattering matrix (which depends
only on its geometry) obtained by the FEM. On the other
hand, any arbitrary perturbating field can be expanded in a series
of cylindrical harmonics, and then, the total field is computed
everywhere using the scattering matrices. This method has the advantage
over conventional FEM approaches that FEM is applied
only once, and then a wide range of electromagnetic compatibility
(EMC) problems can be solved with almost no extra computational
effort. Two-dimensional models of relevant EMC problems involving
both emission and immunity ...
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