%0 Journal Article 
%A Monzó Cabrera, Juan
%A Clemente Fernández, Francisco Javier
%A Pedreño Molina, Juan Luis
%A Díaz Morcillo, Alejandro Benedicto
%A Lozano Guerrero, Antonio José
%T Coaxial to waveguide transitions and device under test characterization by means of inverse techniques
%D 2010
%@ 0895-2477
%U http://hdl.handle.net/10317/1575
%X A new two-tier inverse characterization technique for coaxial to waveguide transitions including a device under test is presented in this paper. The transitions and the device under test are characterized by its scattering parameters and a cascade procedure is used in order to compare calculations and measurements during the unterminating procedure. Two different standard types such as short-circuits and thrus are used, and the two transitions jointly with the device under test are simultaneously characterized. Genetic algorithms and a gradient based method have been used for error minimization during the unterminating stage. Results of this two-tier inverse technique are compared to those provided by measurements, simulations and the three-cavity method, showing that it is possible to properly characterize the coaxial to waveguide transitions and the device under test in a flexible and accurate way.
%K Teoría de la Señal y las Comunicaciones
%K Transición coaxial de guía de onda
%K Dispositivos bajo prueba
%K Técnicas inversas
%K Calibración de dos niveles
%K Coaxial to waveguide transitions
%K Device under test
%K Inverse techniques
%K Two-tier calibration
%K Algoritmos genéticos (AG)
%K Genetic Algorithm (GA)
%~ GOEDOC, SUB GOETTINGEN