%0 Journal Article 
%A Peñaranda Foix, Felipe Laureano
%A Sánchez Hernández, David Agapito
%A Reyes Davó, Elías de los
%A Catalá Civera, José Manuel
%T Precise dielectric properties determination of laminar shaped materials in a partially filled waveguide
%D 1999
%U http://hdl.handle.net/10317/1226
%X An enhanced technique for complex dielectric properties characterization of laminar-shaped materials is presented. The technique is based upon scattering measurements of a partially-filled rectangular waveguide. The influence of the different parameters regarding the achievable accuracy have also been analyzed in order to determine the optimum sample configuration. Measurements of some commercial dielectric substrates used for printed antenna design were performed and have been used for validation purposes
%K Teoría de la Señal y las Comunicaciones
%K Parámetros-S
%K Medición de pérdidas dieléctricas
%K Propiedades dieléctricas
%K Ondas guía de carga dieléctrica
%K Errores de medición
%K Permitividad de medición
%K Guias de onda rectangular
%K Teoría de guía de ondas
%K S-parameters
%K Dielectric loss measurement
%K Dielectric properties
%K Measurement errors
%K Rectangular waveguides
%K Waveguide theory
%K Permittivity measurement
%K Antena de microfranja
%K Microstrip antenna
%K Dielectric loaded waveguides
%~ GOEDOC, SUB GOETTINGEN